Used ELECTROGLAS 4085X #9211992 for sale

ELECTROGLAS 4085X is a high performance prober designed for electrical testing of wafer-level ICs. 4085X operates on Windows-based software and features a wide range of features for electrical testing and probing with sub-micron accuracy. The prober is able to test from 200 up to 400 mm wafer samples. It has a full 5-axis design with a 12-pick-point package handler and is equipped with an E2 tip-alignment system that provides improved alignment accuracy and repeatability. ELECTROGLAS 4085X has a range of different features designed to achieve optimum performance. It has a 6-axis articulated arm, allowing for precise and programmable X, Y, Z, R, P and Yaw movements. The prober also features multiple stages for finely tuned measurements and DFA-accuracy tolerance monitoring. The integrated Dassault Systèmes COMPASS software allows for quick measurement sequence selection. Additionally, the probe station possesses an image processor that uses a high-speed digital signal processor to analyse terabytes of data to identify non-uniformities on the wafer surface to improve electrical test performance. The prober comes with an ITS motion control system, which is a total solution for controllable endpoint motion, enabling precise alignment of pins and probes for electrical tests. It also has macro-programming capabilities and an advanced temperature controller that can manage up to 80C of temperature range while maintaining excellent vacuum and cleanliness of the prober station. In addition, 4085X also has advanced electrical safety pads with 10-pin test adaptors which protect the testing environment from potential risks. The prober is used in a wide range of applications, such as wafer dicing and sorting, laser trimming, trim packing, and IC testing. It also has a durable design, with a robust outer casing and reinforced structure that protect the test module during operation. ELECTROGLAS 4085X prober is highly reliable, accurate and can accurately test wafer samples, even at high frequencies. Consequently, it is a great option for wafer-level IC testing.