Used ELECTROGLAS 4085X #9251750 for sale

Manufacturer
ELECTROGLAS
Model
4085X
ID: 9251750
Wafer Size: 8"
Prober, 8" With TEMPTRONIC TPO 3010 controllers Thermal non-contacting wafer chuck TPO 3010B-2100-1 Temperature controller with IEEE interface Wide temperature range: 200°C DC Control system minimizes electrical noise Temperature stability: ± 0.1°C Temperature accuracy: ± 0.5°C Calibrated against transmission High volume cassette to cassette Advanced thermo chuck design: Low stray capacitance and high electrical leakage resistance Electrical surface insulation: 109 Ohm at 500 V between surface Ground at +25°C Superior chuck temperature uniformity: ± 0.5°C or ± 0.5% of target temperature System controller: RMHN4 Display controller module: DCM3 Prober control module: PCM Vision module: PRM-3 OPTEM HF Video microscope with (2) light sources RAM / REID ASHMAN OM971FF Manipulator SUN MICROSYSTEMS SPARC Server 670 MP Power supply: 208 V, 20 A, 50/60 Hz.
ELECTROGLAS 4085X is a prober designed by ELECTROGLAS at the forefront of semiconductor industry testing, aimed at meeting the most demanding requirements for ultra-high throughput in the most challenging applications. 4085X utilizes a 4-stage, parallel-driven manipulator equipment with multi-axis motion capable of supporting a range of motion up to 500mm. With a maximum, dynamic load of 1kg, all 6-axis are designed to move at up to 1000 mm/sec. With its high speed, accuracy and repeatability requirements, ELECTROGLAS 4085X is perfect for any high-precision test system. 4085X is versatile, featuring two different prober types: the standard type and the high performance type. The standard type features low-force, 200 mm probes, while the high performance type offers enhanced, higher force, 500 mm probes. The standard type is ideal for softer materials, while the high performance type is preferred for harder and more challenging substrates. It also features a proprietary indexer which can be combined with the sophisticated positioning and motion control unit for maximum productivity. Its advanced electronics can support a wide range of controllers and software applications to ensure seamless integration with any test machine. ELECTROGLAS 4085X is also capable of supporting an optional NIST traceable stage calibration package, allowing for perfectly repeatable tests. 4085X is designed to be user-friendly with a graphical user interface for easy control of the instrument. It also has a range of programmable features, including a programmable wafer set up option, allowing for quick and easy wafer loading. Overall, ELECTROGLAS 4085X is a high performance prober ideal for any testing environment requiring accuracy, repeatability, and high throughput. With its customizable options, flexible design, and sophisticated electronics, it's perfect for reducing test times while ensuring optimal precision.
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