Used ELECTROGLAS / EG 4090 #9070789 for sale
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ID: 9070789
Prober
Hot chuck Nickel
EG4090 base unit
Automatic PTPA / needle height aligment
Direct Probe Sensor II (DPS II)
Probe-to-Pad Optimization (PTPO)
Probe Mark Inspection (PMI)
Ink Dot Inspection (IDI)
Wafer Stepping and Scaling Calibration (WSSC)
Automatic Probe Cleaning and Continuity Pad
Chuck Probe Contact Sensor II (CPCS II)
RS232C, TTL (parallel I/O), GPIB (IEEE-488)
EG Enhanced, RDP
Network Interfaces* Ethernet (10/100 Mbps)
Real time wafer map display
Group index
Multi-pass probing
Soak time
CE marked
Bump height setting
St 3 color signal tower
Service manipulator (tester supplier)
Head plate with Top load 9.5" (241mm RC2)
Software: EG Com ver 7
DOS computer
Z-Resolution: 0.25 mil.
ELECTROGLAS 4090 Prober is a semiconductor automated test equipment (ATE). It is designed for high-speed measurement and electrical testing of semiconductor devices, integrating on-wafer probing, wafer sorting, and detailed device characterization. The prober features an integrated XY positioning table with a 1 to 4 inch range, allowing for easy and accurate placement of the device or sample into the test position. In addition, the prober utilizes active electronic alignment for fast and accurate device placement, and an Autoscan function for further alignment accuracy. 4090 Prober houses four channels of analog and digital test circuitry, allowing for fast, consistent and reliable testing of wafer I/O and device performance. The prober also includes a waferChuck, which provides automated contact protection and mechanical electrical isolation between the prober and the device being tested. ELECTROGLAS 4090 Prober also features a rich suite of process control and analysis tools. This includes the Autoselect and Autograph functions, which allow automatic device selection and graphical wafer display while monitoring yield, trend and performance parameters. The prober also contains built-in statistical analysis functions which allow for data correlation and analysis of hundreds of test results in just a few steps. Furthermore, 4090 Prober provides an intuitive graphical user interface (GUI). The GUI allows users to quickly learn the features and commands of the prober and to run tests quickly and accurately. The prober also offers a wide range of resources and tools to help users rapidly develop their own probe programs, and customized scripts can be organized in libraries for later reuse. Overall, ELECTROGLAS 4090 Prober is an excellent tool for high-speed measurements and electrical testing of semiconductor devices. It integrates convenient and accurate on-wafer probing, wafer sorting and device characterization capabilities, as well as intuitive process control and analysis tools. The prober offers both users and engineers a powerful and effective solution for quickly and accurately testing semiconductor devices.
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