Used ELECTROGLAS 4090 #9173115 for sale

ELECTROGLAS 4090 is an advanced wafer prober equipment designed for high throughput automated wafer probing. This prover has a single or dual stage loading module, as well as a four probe head configuration. It is well-suited for automated production testing, validation and qualification testing applications. 4090 also includes full test program development and post-processing of test results. The unit is built with an advanced motion control system utilizing a Linear Motor unit for linear and rotary probing. The automated prober has two stages of servo motors and is capable of handling multiple wafer types. This prober can be customized with a variety of test fixtures, probes and associated software to meet the needs of various end user applications. It is well-suited for wafer probing applications requiring precise probing and detailed test plans. ELECTROGLAS 4090 prober is constructed from materials that provide great strength and durability. It is equipped with standard lid locks, corner supports for precision alignment, an advanced power supply and high quality temperature control machine for accuracy. It also has a spacious travel range for long passes and a rigid frame for high accuracy probing. The Automated Electronics Prober Control (AEPC) provides easy set up and control of all components, with a user-friendly interface and intuitive navigation. The AEPC module also features multiple modular test software packages and automated test sequence commands available to support specific wafer probing requirements. In addition to its test capabilities, 4090 offers a highly accurate automated wafer mapping and wafer image library. The software packages offer advanced sorting and binning capabilities, as well as reporting and statistical analysis. ELECTROGLAS 4090 prober has a high capacity capacity for multiple test configurations, advanced automated test control systems, high accuracy motion control and easy to use software. It is reliable, accurate and well-suited for most wafer probing applications.