Used ELECTROGLAS 4090 #9231745 for sale

ELECTROGLAS 4090 prober is an advanced wafer probing equipment that offers automated wafer handling and testing in the manufacturing of integrated circuits (ICs). It is designed to provide precise measurements of contact electrical characteristics and device geometrical parameters with high accuracy and excellent repeatability. 4090 is based on a single-carrier Electrostatic Force Microscopy (EFM) technology which uses a grid of probes to measure tiny electrical forces. The system is fully automated and designed to reliably measure a wide range of geometrical samples including contact chips, transistors, and through-silicon-vias (TSVLs). The prober is compatible with any manual or micromanipulators, or prober scan head by using a Field-programmable Gate Array (FPGA). This powerful feature allows the unit to accurately detect the small voltage changes of a single contact on a device. For example, it can detect a few milliamps of current leakage in highly reliable devices as small as a milometer. ELECTROGLAS 4090 prober is equipped with a full range of precision positioning devices and sophisticated controllers. The machine can be programmed to select different measuring techniques depending on the characteristics to be measured. It also has a custom scan option which allows for the acquisition of data from any point of interest at flexible speeds. In addition, the tool includes a high resolution Laser interferometer for precise scanning with tight tolerances. It also includes an air-bearing stage to ensure smooth movement with quick and accurate alignment. The asset supports a variety of advanced software features such as multidimensional alignment, test time optimization, analysis of critical parameters, and probes positioning making it suitable for wafer testing and prototyping. 4090 also offers a wide range of advanced measurement capabilities such as electrical contact characteristics, contact angle metrology, contamination testing, and nanomanipulation. It has a specialized environmental chamber, which can regulate temperature and humidity in order to prolong the lifespan of the prober's optics and contact pads. ELECTROGLAS 4090 prober is designed to meet the demanding requirements of today's integrated circuit production lines. Its highly precise measurement capabilities, efficient automation capabilities, and innovative software enable it to reduce wafer testing time and increase throughput.