Used ELECTROGLAS 4090 #9233875 for sale

Manufacturer
ELECTROGLAS
Model
4090
ID: 9233875
Wafer prober Chuck type: Hot chuck ambient Temperature: Up to 130°C Chuck assembly: Gold Operating system: MS-DOS Base pneumatic assembly Chuck-top Pre-aligner assembly T-Arm assembly Indexer assembly A6 A13 VM: OCR and Optics bridge camera controller unit MHCM: A14B PCB Board Missing parts: IDE / Hard Disk Drive (HDD) and Floppy Joystick assembly Power supply No material handler control boards No monitor No chuck forcer No PCM boards Assembly: Main power supply Chuck-top (Gold / Silver) EG Monitor Operator control panel (Joystick assembly) DCM: Floppy A3 Hard disk drive A2 Power supply (PS1) A1 Pentium board, 200 MHz A1A1 Digital communication board A1A2 Ether link communication (Network interface) A1A3 Audible alarm / (2) Lamp drivers A1A6 Marvels (2) Power supply: 200/230V.
ELECTROGLAS 4090 is a prober designed to provide advanced control and accuracy in semiconductor wafer probing. This prober is suitable for high-speed parallel testing and comes standard with secure height adjustment, laser alignment, and touch probe functions. The secure height adjustment feature of 4090 utilizes advanced air bearing technology with user-adjustable air pressure. This provides improved accuracy, reliability, and repeatability over contact-style probers. Additionally, it simplifies adjustment and maintenance, as well as reduces the impact of environmental vibration on the measurements. The prober also features a laser alignment equipment that provides higher accuracy and repeatability than traditional mechanical methods. The system consists of a two-axis laser interferometer and two integrated positioning stages. It can precisely measure probe-to-wafer distances as low as 5 microns, enabling tighter tolerance on test agains defects. ELECTROGLAS 4090 has an integrated touch probe unit that allows for automated measurements on patterns or features. It is equipped with a five-axis control loop, an advanced programmable controller, a touch probe assembly and an automatic loading-unloading tool machine. The prober also features a number of accessories to further customize its use. These include an EDGE™ brand height gauge, an edge-detection library, a solder-thickness scanner and a vacuum cleaner. These functions provide increased accuracy and efficiency in a variety of wafer probing tests. In summary, 4090 is a high-performance prober designed for automated testing. It is suited for a variety of applications and offers users the advantage of secure height adjustment, laser alignment, and touch probe functions. With a comprehensive set of accessories and advanced technology, this prober is capable of achieving the highest levels of accuracy and repeatability in semiconductor wafer probing.
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