Used ELECTROGLAS 4090 #9233875 for sale
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ID: 9233875
Wafer prober
Chuck type: Hot chuck ambient
Temperature: Up to 130°C
Chuck assembly: Gold
Operating system: MS-DOS
Base pneumatic assembly
Chuck-top
Pre-aligner assembly
T-Arm assembly
Indexer assembly
A6
A13
VM: OCR and Optics bridge camera controller unit
MHCM: A14B PCB Board
Missing parts:
IDE / Hard Disk Drive (HDD) and Floppy
Joystick assembly
Power supply
No material handler control boards
No monitor
No chuck forcer
No PCM boards
Assembly:
Main power supply
Chuck-top (Gold / Silver)
EG Monitor
Operator control panel (Joystick assembly)
DCM:
Floppy A3
Hard disk drive A2
Power supply (PS1)
A1 Pentium board, 200 MHz
A1A1 Digital communication board
A1A2 Ether link communication (Network interface)
A1A3 Audible alarm / (2) Lamp drivers
A1A6 Marvels (2)
Power supply: 200/230V.
ELECTROGLAS 4090 is a prober designed to provide advanced control and accuracy in semiconductor wafer probing. This prober is suitable for high-speed parallel testing and comes standard with secure height adjustment, laser alignment, and touch probe functions. The secure height adjustment feature of 4090 utilizes advanced air bearing technology with user-adjustable air pressure. This provides improved accuracy, reliability, and repeatability over contact-style probers. Additionally, it simplifies adjustment and maintenance, as well as reduces the impact of environmental vibration on the measurements. The prober also features a laser alignment equipment that provides higher accuracy and repeatability than traditional mechanical methods. The system consists of a two-axis laser interferometer and two integrated positioning stages. It can precisely measure probe-to-wafer distances as low as 5 microns, enabling tighter tolerance on test agains defects. ELECTROGLAS 4090 has an integrated touch probe unit that allows for automated measurements on patterns or features. It is equipped with a five-axis control loop, an advanced programmable controller, a touch probe assembly and an automatic loading-unloading tool machine. The prober also features a number of accessories to further customize its use. These include an EDGE™ brand height gauge, an edge-detection library, a solder-thickness scanner and a vacuum cleaner. These functions provide increased accuracy and efficiency in a variety of wafer probing tests. In summary, 4090 is a high-performance prober designed for automated testing. It is suited for a variety of applications and offers users the advantage of secure height adjustment, laser alignment, and touch probe functions. With a comprehensive set of accessories and advanced technology, this prober is capable of achieving the highest levels of accuracy and repeatability in semiconductor wafer probing.
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