Used ELECTROGLAS 4090 #9236524 for sale

Manufacturer
ELECTROGLAS
Model
4090
ID: 9236524
Prober Chuck type: Hot chuck Ambient temperature: Up to 130°C Spoilt joystick board Material handler control module with boards and cables Transfer arm Operating system: MS-DOS Assembly: Main power supply Chuck-top: Gold Base pneumatic assy Pre-aligner: No CCD T-Arm assy Indexer assy DCM: A6 A13 A1 200 MHz Pentium board A1A1 Digital communication board A1A2 Ether-link communication (Network interface) A1A3 Audible alarm / (2) Lamp drivers A1A6 (2) Marvels MHCM: A14B PCB Board VM: OCR and Optics bridge camera controller unit PCM Board: A1A2 X Power dar 3 A1A1 Y Power dar 3 Utilities supply: CDA: House air 80 to 90 psi Vacuum: 22-26 in. Hg Missing / Fault parts: EG Monitor Loader Assembly: Operator control panel (Joystick assy) Chuck-top DCM: A3 Floppy disk drive A2 Hard disk drive Power supply (PS1) PCM Board: A2A10 Ring carrier controller A2A911 MUX / Driver A2A7 Extended flash memory A2A5 Theta, Z and joystick A2A4 Tester interface A2A2 Motion control logic A2A1 CPU Power supply: 200/230 V.
ELECTROGLAS 4090 prober is an automated high-precision probing equipment designed for semiconductor device testing. This system is engineered with an extremely reliable probing unit and state-of-the-art precision motion control technology. The machine is designed to provide reliable and high quality test measurements for a wide range of device types. This prober features a precision motorized sample stage that can be programmed with simple instructions and re-programmed as needed without time-consuming setup. The prober also features a three-dimensional wafer map generation tool to ensure accuracy and repeatability. The position of the sample stage can be controlled with a combination of high speed linear galvanometers and closed-loop feedback asset. The prober also features precision alignment capabilities, including auto-focussing and calibration. These features help to ensure that the prober is able to accurately and accurately probe devices on the wafer with a high degree of accuracy and repeatability. The prober also comes with a variety of advanced software packages designed to facilitate the setup and run of automated wafer testing. These software packages include automatic test program generation, automated test parameter configuration, and user-friendly test report generation. Additionally, the user can easily access the feature to view results and generate 3-D graphs of test results. The prober also comes with a broad range of operational features and options. These include backlight and zoom control, various output formats, sample stage flipping settings, and various probe handling functions. The prober also offers extensive customization options, allowing the user to easily configure the model for their specific applications. 4090 prober is a powerful high-precision probing equipment that has been designed to provide accurate measurements for a wide range of device types. Its reliable and high quality construction offers users a reliable and high-precision testing system that can be easily programmed and customized to meet their specific testing needs.
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