Used ELECTROGLAS 4090 #9282326 for sale

ELECTROGLAS 4090 is an advanced prober designed for comprehensive testing of a variety of wafers in the embedded semiconductor industry. This equipment is capable of rapidly testing wafers up to 265mm in size and offers a variety of testing and probing capabilities. The prober is designed with a high-precision 8-degree rotary stage that can rotate in both directions for testing of complex structures. The upper section of the prober utilizes an automated head which is suspended above the workpiece and moves horizontally along the x- and y-axes. The Advanced Prober Control software also allows the system to be configured with high speed autofocus and advanced wafer handling features. 4090 has an impressive travel range of 612mm x 762mm, with a resolution of 1 micron and an accuracy of 3 microns. It also features an XYZ travel ranges of 140mm x 125mm x 4mm. This prober provides an extremely high probing pressure of up to 5MPa, and can also be configured to provide a low-pressure, low-temperature test environment. ELECTROGLAS 4090 is equipped with a wafer chuck which uses a multi-contact vacuum unit for holdfasting, and is capable of probing up to 900 sites per hour with precision and speed. The prober is capable of full production level throughput for high-volume, high-yield applications, and is designed for multiple operation throughout the night and day. Additionally, 4090 has an integrated automated machine for loading, unloading, and inspection of wafers. The tool also provides a wide range of features and options such as wiring check, clip handling and cabling, force mode testing, test management software, software control, user interfaces, and a variety of probing tips and extension parts. The prober also has multiple language support and full network connectivity support, allowing it to be integrated into any process management asset. Overall, ELECTROGLAS 4090 is a powerful and efficient prober, enabling users to quickly perform high-volume probing operations with reliable accuracy. The model is extremely compact and compact, providing a wide range of debugging and testing options for complex integrated circuits.