Used ELECTROGLAS 4090 #9298849 for sale

ELECTROGLAS 4090 prober is a reliable and precise tool used during semiconductor package testing and wafer level testing processes. It provides a wide range of features and options that help reduce test times while accurately measuring electrical or physical parameters. 4090 is a high performance prober offering up to 55.9 µm XY resolution and features a small foot print which ensures a fast set-up and easy usage for small production runs. It has a 6" probing table and offers a test area of 125 x 75 mm2, as well as up to 82 axes of movement, enabling efficient testing without the need to re-position the wafer or package. The prober is designed with a variety of high-tech materials and components, such as advanced signal generation circuits, high definition digital circuits, and a highly accurate piezoelectric actuator system, providing reliable and repeatable test results. The advanced signal generation circuits allow changes in the parameter to be done quickly and accurately, increasing the overall testing speed and accuracy. In addition, the high definition digital circuits provide a reliable and repeatable measurement data. The prober is equipped with a real-time high-speed closed-loop control system and a fast high-speed command sequencer to ensure faster and more accurate test execution. ELECTROGLAS 4090 prober also features a selectable test mode, allowing users to select either parallel or serial testing, increasing the number of possible tests. Additionally, the prober has several standard interfaces and options, including Ethernet, allowing users to access remote testing, and support for several industry accepted test software packages. In conclusion, 4090 is an advanced and reliable prober designed for fast and accurate testing. It comes with a wide range of features and options to meet various testing needs and it provides reliable and repeatable test results. The prober is easy to use and its small foot print ensures a fast set-up and allows users to efficiently test small production runs.