Used ELECTROGLAS 4090F #9329016 for sale

ELECTROGLAS 4090F is an automatic electronic prober, designed to test and analyze components and devices. This prober is used mostly in the electronic and semiconductor industries. It is used for the detailed characterization of a variety of components as well as device options, including testing and evaluating their operating speeds and power dissipation. 4090F uses an internal GPS system in order to ensure precise positional accuracy and repeatability in operations. This is an important quality in such applications, where precise data is essential for the success of the operation. Additionally, ELECTROGLAS 4090F features enhanced vision capabilities, for improved accuracy and imaging optimization. 4090F is a fully-automated system that promises reduced setup time and a minimized need for external supervision. It has an adjustable scanning field-of-view, with an integral high-performance video camera in order to guide operations and ensure the quality of testing data. Additionally, the interface is both modern and easy-to-use, improving user experience. With the intuitive software features of ELECTROGLAS 4090F, this prober is designed to work with a number of motion control systems, making integration with existing operations as simple as possible. 4090F also features high-precision mechanical axes with multiple scanning capabilities. These are designed to accurately measure and analyze devices in a range of sizes and shapes, making them suitable for a wide range of products and applications. Additionally, the prober is highly durable, enabling it to perform a variety of testing tasks, in harsh environmental conditions. It is also equipped with a high-voltage protection, and meets all the safety requirements. ELECTROGLAS 4090F is an ideal choice for automated testing and characterization in the electronics and semiconductor industries. Its combination of high-precision performance, intuitive software and user-friendly interface, make it the perfect tool for accurately and efficiently testing and analyzing a number of device and component options.