Used ELECTROGLAS 5300 Argos #159153 for sale

ELECTROGLAS 5300 Argos advanced wafer prober is designed for full, front-side and back-side characterization of today's most advanced CMOS and MEMS devices. This tool offers a wide range of integrated capabilities to help chip designers and manufacturers streamline their testing, characterization and process development. 5300 Argos features a large work envelope to accommodate the latest X, Y and Z axes, as well as the most advanced probe cards and USB connections. ELECTROGLAS 5300 Argos' advanced design features a generous work envelope up to 25 x 19.5" and a thin 12.7 mm max. component height. It offers an easy-to-use touch-screen user interface for wafer characterization and articulating arm guidance for probing and handling. 5300 Argos also supports advanced motion and positioning systems with sub-micron accuracy, providing maximum throughput and reliable results. ELECTROGLAS 5300 Argos' intelligent tooling is designed for accuracy and control with its dual-track probe card support and advanced clamping equipment. This system is designed for multi-site, multi-die and multi-chamber testing. The automated probe card loading and unloading unit simplifies the installation and removal of the probe cards, allowing the exchange of multiple probe cards quickly and easily. 5300 Argos provides high temperature control and stability, which is critical to ensure yield, while minimizing handling of sensitive devices. It offers a temperature range of -25°C to +50°C in a single unit, giving a total test coverage of 100°C. ELECTROGLAS 5300 Argos also features a die-by-die repeatability tooling machine, enabling greater accuracy and repeatability of test results. It is also optimized for efficiency and reduced cost of ownership via its robust design, user-friendly operation and low maintenance requirements. 5300 Argos is a robust and high-efficiency tool for chip designers, chip test engineers and engineers alike. It is designed for precision, with integrated powers meters and sensors for real-time measurements and diagnostics at each contact point. It provides a reliable and cost-effective means of testing, characterization and process development.