Used ELECTROGLAS 5300 #9083774 for sale

ELECTROGLAS 5300 is a high-precision prober that can be used for a variety of wafer probing and electrical test requirements. It has four stations that provide two as probe heads and two as contact arms. This combination allows for higher productivity and flexibility when testing semiconductor wafers and circuits. 5300 can be used to perform electrical testing such as capacitance, current-voltage, and ohmmeter tests as well as device characterization, semiconductor device fabrication, and various other wafer probing applications. ELECTROGLAS 5300 prober has a high-precision digital scanning system that allows it to accurately position probes on even the most complex chip designs. It also has a flexible four-station double-deck manipulator, that allows for simultaneous probing and testing of multiple test points on a single wafer. Additionally, it can be used for contact and non-contact testing, allowing for many different types of tests and probes to be used. 5300 has several features that make it particularly appealing for use in semiconductor device characterization and fabrication. It features an advanced multi-layer probe card, which has an extremely small spot size of 0.2 to 0.4 um and can be used to probe many locations simultaneously. This reduces the time it takes to complete a test. Additionally, it has a variable-pressure manually-adjustable contact arm, allowing for precise application pressure at any time. Furthermore, its fully-floating probe mounting options increases the accuracy of the testing results. ELECTROGLAS 5300 also supports several software packages for design and simulation, such as MEDICI, ISEC and Techplan. These packages allow users to evaluate design performance and to optimize test results, making it easier to perfect their design. Furthermore, the prober is compatible with MultiProbe, an integrated software package and intellectual hardware platform, which makes device testing easier and faster. Overall, 5300 is an excellent prober for device testing, fabrication and characterization. It combines a variety of features, such as its high-precision scanning system, variable-pressure contact arm, and integrated software platforms, to provide users with a powerful and flexible prober that can be used to tackle a wide range of test projects.