Used ELECTROGLAS 5300 #9206439 for sale
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ELECTROGLAS 5300 Prober is a precision tool used for testing of semiconductor devices. This tool has the capability to quickly and accurately perform a wide variety of testing operations such as probing, wafer probing, systems test and burn-in. 5300 Prober is equipped with a plethora of features and technologies that make testing possible. The prober is designed to be easy to operate and offer maximum performance during testing operations. Its software package is designed to be user friendly, while allowing for unlimited customization of settings to meet an individual range of needs. It offers a variety of test processes such as high accuracy probing, broadcast tests, and parameter sweep tests. The prober also features a removable and replaceable chassis. ELECTROGLAS 5300 Prober is designed to precisely align and probe each contact point in an orderly and repeatable manner. It features a high-precision, dual-axis alignment system, which enables the user to quickly and accurately adjust each testing axis for maximum alignment. The prober also features a programmable lifting system which allows for precise measurements of components in test fixtures. During the testing process, the tool's advanced software continually monitors the testing conditions, resulting in optimized testing procedures. The prober's flexible configurations allow users to select probes, test sockets, and jigs that are compatible with the device being tested. 5300 is also equipped with a built-in plotting system allowing users to easily visualize the test results. The prober is also equipped with monitoring and reporting capabilities that provide users with a comprehensive picture of the performance of the device. This allows the user to quickly troubleshoot any issues that may arise and make necessary modifications in their test settings. ELECTROGLAS 5300 Prober is designed to stand up to years of continuous, high-volume testing reliably and with high accuracy. Overall, 5300 Prober is an advanced testing tool designed to meet the needs of a wide variety of applications in the semiconductor industry. Its precision alignment, flexible configurations, and monitoring and reporting capabilities make it well-suited to helping users quickly and accurately test a variety of semiconductor devices.
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