Used ELECTROGLAS 5300e #200853 for sale

ELECTROGLAS 5300e is a prober, a precision testing tool used for electrical testing of integrated circuit components. It is designed for high-accuracy, high-speed probing of advanced semiconductor devices, to ensure they are working correctly and will continue to do so in future operations. 5300e is capable of providing the following functions: wafer bump probing, device characterization, defect analysis, electrical testing of dense arrays, and failure analysis. The prober is equipped with a cutting-edge microscope that enables the operator to clearly see the extremely small connections of the semiconductor devices. ELECTROGLAS 5300e is a high-speed micro-positioner with a two-step, low-noise stepper motor drive. The micro positioning accuracy and repeatability are within 1μm for 1mm travel. The equipment is also engineered to offer even greater accuracy for low volume/ low probe density applications. The micro-positioner supports multiple sensor types, including capacitive, mechanical, and optical sensors, enabling a wide range of probe cards and prober configurations. 5300e is outfitted with a fully software-controlled XYZ Stage, including dual independent z-axes, which can be used to target non-symmetric wafer levels and components. Both z-axis stages have Anti-Backlash Nut assemblies, providing superior positioning accuracy. A three-zone temperature system ensures active and inactive zones stay at precise, consistent temperatures, while ensuring long specimen life by preventing overheating. The prober is equipped with a variety of wafer handling systems, including auto-ejectors, pass-through mechanism, cassettes, and precision loading jigs. ELECTROGLAS 5300e also includes a four-axis, 4-wire open-loop stepping motor and closed-loop motor control unit to enable precise, timed, and repeatable movement of wafers, devices, and other components for accurate and reliable device characterization measurements. The machine also supports various probing modes, such as high speed, high accuracy, and low voltage probing. 5300e provides an extensive array of data analysis and diagnostic tools to ensure the most compatible and reliable results. Advanced software features, such as ProLog and Badger View, allow users to quickly analyze performance characteristics of a device, as well as localize test failures and troubleshoot device malfunctions. Prober data management capabilities also enable easy data retrieval and prober scripting controls. ELECTROGLAS 5300e is built to withstand extreme working environments, with a dust- and liquid-resistant case and a temperature-controlled environment. The integrated safety systems, such as the Ensemble's solid-state relay tool, prevent potential hazards due to electrical failures. The asset also includes advanced point-of-use tools for calibration and diagnostics, as well as various other sophisticated features. 5300e prober offers unparalleled accuracy, reliability, and performance, making it an excellent choice for testing advanced semiconductor devices.