Used ELECTROGLAS 6000 #9244387 for sale

ELECTROGLAS 6000 is a high-performance prober designed for advanced semiconductor testing and probing environments. It is optimized for small, customized probing applications and offers high probing accuracy, repeatability, and throughput. 6000 is a state-of-the-art prober that features a small footprint and outstanding performance in its class. This prober is designed for high-speed probing and time-efficient probing of ICs (Integrated Circuits) and other components. It features an advanced, high-resolution imaging system that offers the highest levels of accuracy and repeatability available. Additionally, ELECTROGLAS 6000 has auto-signal-analysis capabilities, allowing for fast and accurate measurements of signals on a DUT. The prober also offers strong integration capabilities with RF (Radio Frequency) and other probing systems, allowing for testing and probing of complex signals. 6000 supports a wide range of test and probe channels, including up to 8 high accuracy probing channels. This prober also includes a scanning blade and motorized feet, offering flexibility and easy setup. Additionally, adaptive kinematic probing is available, allowing for the highest levels of accuracy and throughput. ELECTROGLAS 6000 also provides software controlled automation and automatic error recognition and correction. 6000 has an intuitive touchscreen interface, allowing for easy operation and navigation. The prober also features comprehensive diagnostic capabilities, including an integrated thermal system for rapid and efficient heat management. Furthermore, ELECTROGLAS 6000 offers a range of Force Mode applications with integrated smart commands that enable the capturing of real-time signals with less stress and higher accuracy. Overall, 6000 is a powerful, automated prober that is optimized for testing and probing of chips, ICs, and other components. It is a highly reliable, high-performance prober that offers superior probing accuracy, repeatability, and throughput. This prober also supports a range of auto-signal-analysis capabilities, integrated RF probing systems, and advanced software-controlled automation. The intuitive touchscreen interface and comprehensive diagnostic capabilities make it a great choice for advanced semiconductor testing and probing environments.