Used ELECTROGLAS 6000 #9244389 for sale
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ID: 9244389
Prober
X, Y Stage with prober control, 12"
Hot chuck top assy, 12"
Vision module with dual bridge CCD camera
Wafer profiler kit
Inker & edge sensor box
Cassette wafer loader
LCD Touch screen monitor
PZ7 Z Stage: 0.125 MIL
Probe To Pad Alignment (PTPA)
Direct Probe Sensor II (DPS II)
Probe Mark Inspection (PMI)
Self Teach Auto Alignment (STAA)
Wafer Stepping & Scaling Calibration (WSSC)
AC Input: 220V
TTL & GPIB Interface: RS-232.
ELECTROGLAS 6000 is a high-performance prober used primarily for probing and testing circuit boards and integrated circuits in the semiconductor industry. Its features include a large number of components and enhancements, such as advanced automation capabilities, top-of-the-line thermal and vacuum systems, and high-precision motion control, making it one of the best-performing equipment available. The automated workcell of 6000 is designed to minimize the installation time and provide greater efficiency and accuracy during probe testing. The workcell automation is managed by a hard-drive-based touch-screen control equipment that is capable of managing up to six chambers and sixteen sequential probing operations, thus reducing manual intervention by the user. In addition, the station features an accurately machined base plate for use in vision-based applications. The high-precision motion control system in ELECTROGLAS 6000 is the perfect solution for achieving the highest accuracy motion control of different types of probes. It utilizes an ultra-precise, low-noise drive unit and mini-catheter servo capacitance probes to guarantee the highest level of performance and accuracy. Aside from the motion control machine, 6000 also features superior thermal and vacuum control systems. The thermal control tool utilizes a highly efficient thermal management asset that is capable of providing stable and uniform temperature control throughout the test environment. The vacuum model is specifically designed to provide precise and repeatable control of both pressure and in-situ vacuum levels, and to minimize equipment drift and process variation during testing. Finally, ELECTROGLAS 6000 is designed to allow for programmable access to different parameters and timing events, enabling for easy and precise tuning of the system. This feature is particularly important for high-volume production processes, where the time and consistency of the process is key. Overall, 6000 is a high-performance, highly sophisticated, and extremely reliable prober unit that is designed to provide the highest accuracy and repeatability during testing of different types of components. With its advanced automation capabilities, high-precision motion and thermal control systems, and user-programmable access to different process parameters, ELECTROGLAS 6000 is one of the most advanced solutions available for semiconductor testing and probing.
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