Used ELECTROGLAS EDS #9316793 for sale

ELECTROGLAS EDS prober is a highly advanced, high precision device used to measure and diagnose semiconductor devices. This semi-automated equipment is designed to increase the speed and accuracy of measurements of critical device parameters. It measures a wide range of device types, including both CMOS and bipolar devices, focusing on areas such as junction capacitance, capacitance-voltage, transconductance and surface resistance. The system is comprised of a number of interdependent components, including machine control, test unit, and data acquisition. The machine control enables the operator to execute measurements and calibrations, control the movement of prober arm and X-Y table, and ensures the device is correctly positioned and firmly held. The test machine is responsible for providing the electrical bias and measurement signals, and the data acquisition is used to process the results and store them in memory. EDS prober takes advantage of advanced scanning capabilities to improve measurement accuracy, as well as allowing optimization of the device probing process. This is accomplished by using precise motor and servo control to accurately scan and measure the device to many different points across its surface. This scanning process allows the tool to quickly and accurately pinpoint the out-of-specification points, speeding the device debugging process. This asset is designed for operation in a cleanroom; the walls and floor are lined with adjustable insulation to ensure minimal electrical noise. The prober itself is specifically designed to reduce electrostatic interference, providing very accurate results. Overall, ELECTROGLAS EDS prober is a robust and reliable tool for semiconductor device testing. It provides high-precision results, with circumspect scanning for accuracy and reliability, and built-in protection against electrostatic interference. With its various components, it is well suited to quickly and accurately identify the source of any device failure. It is clear that this prober is an excellent choice for any semiconductor device testing requirements.