Used ELECTROGLAS / EG 1034X #293657259 for sale

ELECTROGLAS / EG 1034X
Manufacturer
ELECTROGLAS / EG
Model
1034X
ID: 293657259
Wafer prober.
ELECTROGLAS / EG 1034X is a single-pass submicron prober that provides superior probing performance. The prober is designed for wafer probing applications at higher speeds, higher accuracy, and lower cost than traditional wafer probing solutions. EG 1034X is equipped with a high-speed, drive module that rapidly accelerates and decelerates the stepper motor for maximum throughput and precision. The prober features a continuous motion motion motion equipment that employs indexing pins, springs, and proximity sensors to supply the repeatable motions and positional accuracy. ELECTROGLAS 1034 X is designed for operation with a variety of different probing tips, including standard ceramic and diamond tipped tips for probing applications. The robust motion control and positioning system allows for probing in a variety of different sample types. The prober also features a tool-less probe module exchange unit that allows for fast, easy switching of probes and sample chips. In addition, ELECTROGLAS / EG 1034 X is equipped with an advanced vision machine, which utilizes CCD cameras and lasers to detect different sample characteristics while the probe tip is moving. This vision tool allows for visual inspection and alignment of probes, as well as proper measurement of probe positions and variables such as sample size, shape, and orientation. The prober is also equipped with an application-specific software asset that allows for easy setup and operation of the equipment. The software model enables users to customize their probe profiles and control three-dimensional motion and position control. The user interface provides access to machine settings and controls, allowing for fast, accurate setup and operation. The software also offers a wide range of analytical and reporting capabilities, allowing users to gain deeper insights into their probing applications. EG 1034 X is an ideal solution for wafer probing with high speed, accuracy, and quality. Its advanced features provide maximum reliability and accuracy, while its easy operation and flexible customization options make it an excellent solution for quality control in today's production environments.
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