Used ELECTROGLAS / EG 1034XA-6 #27329 for sale

ELECTROGLAS / EG 1034XA-6 is a prober designed for use in the semiconductor industry. It is the most recent model in the 1034 series of probers, released in 2018. It is used to inspect, measure, and characterize electrical and physical properties of semiconductor ICs and other devices. EG 1034XA6 has a wide range of features and capabilities. It can perform high-speed wafer probing, low-current data and device characterization, and leak detection analysis. The prober is capable of probing multiple sites at the same time with multisite probing and automated production test sequences that can save valuable time. It supports 2D/3D memory test and optimized yield analysis, which reduces test cycle time. The prober has a large probe array, with up to 512 channels of two types: short and full. The array is designed for maximum test site flexibility, so that it can precisely probe different sizes of ICs. The array is constructed with a precision ceramic wafer stage for fixed and repeatable positioning of the wafers. An air bearing platen assembly provides low friction transport and repositioning, ensuring reliable wafer contact. ELECTROGLAS 1034X-A6 can be operated by a touch screen operator interface, PC or PC with programming software, or remotely. With its open architecture, the prober is compatible with production monitoring systems, general-purpose research systems, and factory automation solutions. ELECTROGLAS / EG 1034XA6 prober offers high signal traces and low noise across a wide range of frequencies, and it can be used in a large range of temperatures and environmental conditions. It is powered by a stable, long-lifetime power supply, specifically optimized for minimal drift and jitter. It supports GPIB, IEEE488.2, and CAN bus interfaces, allowing for communication with other test equipment. ELECTROGLAS / EG 1034 XA-6 is a highly advanced prober, designed for the most demanding semiconductor test applications. It has a wide range of features, providing a customizable solution for testing a range of operations and wafer sizes. 1034X-A6 prober can be used to measure and characterize electrical and physical properties of semiconductor ICs and other devices, and it is capable of probing multiple sites at the same time.