Used ELECTROGLAS / EG 1034XA-6 #9003465 for sale

ELECTROGLAS / EG 1034XA-6 is a semiconductor prober designed for automated wafer probing and testing. It is capable of testing, analyzing and characterizing wafers with up to 100 pins and their associated elements. EG 1034XA6 is equipped with a high accuracy X-Y servo driven platform which allows ultra-precise wafer placement and movement. It also includes an automated shuttle arm, allowing wafers to be moved to different locations and tested in different calibrated environments. ELECTROGLAS 1034X-A6 utilizes a high resolution microscope to provide precise inspection of wafer surface condition and interactions with test probes. The prober is also equipped with advanced in-situ metrology, enabling the accurate measurement of impedances, capacitance, resistance and other component parameters. It is compatible with various software packages, including Autotec and LabVIEW, allowing for the capture and storage of test data. The prober utilizes an electrostatic chuck and a vacuum probe head, both of which are designed for superior electrical contact and repeatability. It also includes a motorized chuck lift equipment, allowing precise placing of wafer without damaging its surface. ELECTROGLAS 1034XA6 is equipped with air purge capability to minimize contamination while testing or moving wafers. The instrument is designed for easy maintenance and repair, with a robust construction and a high degree of reliability. It can be automated through any of its functions and data acquisition is enhanced through a comprehensive range of views and data display formats. Furthermore, EG 1034 XA-6 incorporates advanced safety features such as a control-lock system, a power-up safety test procedure and iKey unit to prevent unauthorized access to machine panels and settings. Overall, 1034 XA-6 is a powerful, reliable and versatile prober designed to handle a variety of analytical needs. It is accurate and precise, and provides exceptional performance, reliability and safety, making it an invaluable tool for semiconductor testing, characterization and inspection.