Used ELECTROGLAS / EG 1034XA-6 #9350552 for sale

ELECTROGLAS / EG 1034XA-6 is a semiconductor prober designed for advanced characterization and probing of integrated circuit devices. This prober is suitable for use in any semiconductor product development or manufacturing process, offering precision accuracy and repeatability in testing results. The prober features a unique electrostatic chuck equipment, allowing for placement of samples on the chuck without the need for any mechanical alignment. This system also features an adjustable resolution that allows for precise levels of alignment and accuracy in sample placement. The unit offers a large 6 inch x 6 inch probing area, which allows for testing of multiple dies at once. An advanced vision machine is integrated into the tool, allowing for precise alignment of test-probes to the sample. The prober also offers high-speed delivery of test data, with a maximum probing speed of 200MHz. The integrated software controls all aspects of the machine, and allows for customization of settings based on specific needs and testing requirements. An automated probe-lifter asset is also integrated into the prober, allowing for safe and efficient operation of the model. The equipment also features multiple safety features to ensure proper operation and accuracy, such as power limiting, static control, and a ESD protection system. Additionally, the unit is designed to reduce the amount of noise generated when probing, ensuring accuracy in test results. The prober also offerseasy installation and maintenance, with all parts being easily accessible and replaceable should the need arise. In addition to probing capability, the machine also offers advanced wafer handling and wafer carrier control, allowing for consistent and repeatable testing results. The tool includes microprocessing capabilities, allowing for the analysis and display of results in real time. Multiprocessing and multiple power-supplies allow for numerous simultaneous probing operations. EG 1034XA6 prober is an advanced solution for semiconductor characterization and probing, offering precision accuracy and repeatability in testing. With multiple safety features, high-speed delivery of test data, wafer handling capabilities, and microprocessing abilities, this prober is sure to be a valuable addition to any semiconductor manufacturing process.