Used ELECTROGLAS / EG 2001 / 2001X #293602009 for sale

ELECTROGLAS / EG 2001 / 2001X is a self-contained, modular prober platform designed for automated semiconductor inspection and testing. EG 2001 / 2001X comprises a comprehensive set of features, including: a fully-coupled XYZ motion stage, high-speed voltage and current measurements, precision force sensing, vision-guided probing, programmable equipment control, and an array of workplace connectivity options. ELECTROGLAS 2001 / 2001X large-scale motion stage provides two-dimensional travel across five axes: X, Y, Z, Theta, and tilt. This advanced motion stage system equips the prober with a wide range of motion, allowing it to quickly and accurately move around wafers, chips, and other objects. The stage is driven by an industry-standard stepping motor drive, making it responsive and reliable. The precision force-sensing of 2001 / 2001X measures contact force between the probes and the sample. The accuracy and resolution of the force sensor enables even the faintest signals to be measured, thus providing reliable performance. The prober offers a range of high-speed voltage and current measurement capabilities, including measurements of potential and current up to a frequency of 100MHz. Users can also configure sweep measurements and adaptive applications with the prober's powerful programming language. ELECTROGLAS / EG 2001 / 2001X contains a vision-guided probing capability using a match-rate algorithm for location calibration. This makes it an ideal choice for application and production test jobs, as it provides fine-tuned, repeatable probing results. EG 2001 / 2001X includes a programmable unit control that can be accessed through a series of simple commands. This makes it easier to integrate the prober into existing test setups and machine architectures. In addition, the prober is equipped with physical and logical I/O to allow communication with external devices. In summary, ELECTROGLAS 2001 / 2001X is a reliable and versatile prober tool that can be used for automated semiconductor testing, inspection, and analysis. It is equipped with a robust motion stage, high-speed voltage and current measurements, force sensing, vision-guided probing, and a programmable control input. The prober is highly configurable and can be easily integrated into existing testing environments.