Used ELECTROGLAS / EG 2001 / 2001X #293609453 for sale

ELECTROGLAS / EG 2001 / 2001X is a prober designed for automated test, measurement, and performance analysis of integrated circuits and discrete components. It is one of the most widely used probers for wafer level testing. EG 2001 / 2001X offers a fully integrated solution for probing systems, including the machine's frame, mainframe electronics, console and support modules, prober legs and the suitable tools for pad capture and probing. ELECTROGLAS 2001 / 2001X is a compact prober equipment with a greater capability for electrical testing, its automatic wafer handling is done with pinpoint accuracy and a robust, reliable design ensures zero maintenance over time. The system is also highly ergonomic and easy to use, making it ideal for both small and large production runs. 2001 / 2001X prober unit can be tailored to the user's application, either with a single layer probe card or a multi-layer probe card installation. It is capable of handling any device size including the advanced flip-chip, or hybrid circuitry. ELECTROGLAS / EG 2001 / 2001X is compatible with a wide variety of electrical tests, including digital voltage, current measurements, switching point measurements, impedance and time domain tests. It also supports a wide variety of power control, high speed clock control, and wafer alignment for testing advanced devices. The fully integrated solutions for probing systems features high speed data collection and analysis through advanced software tools, such as EG-VTRACE and ELECTROGLAS-VConnect. EG 2001 / 2001X prober systems feature advanced vacuum capabilities, providing superior force control over a wide range of temperatures from -20 Degrees C to 105 Degrees C. It also offers high stability and accuracy for both standard manual probing and automated test applications. The fully integrated electrical test machine for probing systems is configurable through the flexible EasyLink software, providing a range of options including wafer maps, required time adjustments, control of probe potential and other necessary parameters to secure repeatability between production lots. In addition, ELECTROGLAS 2001 / 2001X provides full configurability of the machine and its environment parameters including manual/automatic operation, the user interface, test configurations, chuck and chuck tilt adjustments, data analysis and more. The prober also supports the use of different electrical test accessories, enabling operators to customize their test setup. Overall, 2001 / 2001X is a compact prober tool with an expansive range of capabilities and features for automated test, measurement and performance analysis. It is capable of handling any device size and provides fully integrated solutions for probing systems for superior accuracy and repeatability. It is an ideal choice for small and large production runs, making it a great choice of prober for high-end applications.