Used ELECTROGLAS / EG 2001 #293659202 for sale

ELECTROGLAS / EG 2001 prober is a specialized tool designed primarily for semiconductor integrated circuit (IC) testing. It is used in semiconductor companies for manual probing of wafer test structures and ICs. The device combines a precision wafer handling equipment together with an intuitive, multi-axis adjustable probe head, making it suitable for both manual and automated testing. EG 2001 prober consists of a base unit, a vertical probe head, and a horizontal probe head, all mounted on stable platforms. The base unit contains the main electronics and servo motors, which control the vertical and horizontal motion of the probe heads. The probe heads consist of several adjustable contacts that allow different probe cards to be loaded into the system. Each probe card contains a set of pre-loaded probes that are finely angled for accurate probing of the ICs. The vertical and horizontal probe cards are each driven by a controller in the base unit. Each controller has two modes, manual and automatic, allowing for either manual or automatic probing of ICs. In manual mode, the operator can adjust the vertical and horizontal axes of the probe heads to access on-wafer test points in a manual fashion. In automatic mode, the operator can program a set of instructions for the unit to follow when probing each IC. ELECTROGLAS 2001 prober is equipped with a touchscreen interface, which provides the operator with visual feedback about the probes as they make contact with the IC. The machine also has an enterprise-level software package that allows for remote monitoring of the prober's status and metrics. This feature allows technicians to remotely modify test parameters, saving time and effort. Overall, 2001 prober is an ideal solution for semiconductor companies looking for a reliable and accurate Probe testing station. The device combines a precision wafer handling tool with adjustable probe contacts, a touchscreen interface, and sophisticated software, allowing operators to quickly and accurately troubleshoot ICs. This intuitive device is able to optimize wafer probing operations with minimal effort from the operator.