Used ELECTROGLAS / EG 2001CX #293762403 for sale

ELECTROGLAS 2001CX is an advanced prober that has been designed to make precise automated probing of integrated circuits and related microelectronic components easy and cost-effective. 2001CX is a high-end prober designed to offer the very best in accuracy and repeatability for a wide range of probing applications. ELECTROGLAS 2001CX is designed for precision probing of a variety of wafer sizes with capability to accommodate wafers between 10 mils to 150 mils in thickness. The prober utilizes a specialized optical profile sensor, able to determine contact point of the probe with a contact accuracy of up to 29.53 nm (1.15 millionth of an inch). This offers automatic probing for high quality ICs and microelectronic components with accurate and repeatable contacts between probes and test points. 2001CX also features a unique 4-axis system which enables the automation of a variety of probing techniques, such as manual probing, vector final test, algorithmic testing, and load board testing. This makes it ideal for applications such as reliability testing, functional testing, ESD testing, and other intense automated testing requirements. ELECTROGLAS 2001CX also features an intuitive graphical user interface, enabling easy and convenient operation without the need of any additional programming knowledge. Additionally, the prober also comes with a variety of advanced tooling and support options, enabling intuitive alignment, precise wafer movement and ability to accommodate a wide range of wafer sizes. Moreover, the prober is also compatible with a wide range of peripherals and compatible systems, enabling integration of automation systems for complex and multi-step test suites. Overall, 2001CX is an advanced prober designed to provide the highest quality of automated testing and probing of integrated circuits and microelectronic components. With highly accurate contact points, intuitive GUI and compatibility with various automation options, ELECTROGLAS 2001CX provides all the necessary functionality for creating a highly efficient and cost-effective test and probing environment.