Used ELECTROGLAS / EG 2001CX #9170445 for sale

ELECTROGLAS / EG 2001CX is an advanced prober equipment designed to automate the probe testing process and increase the accuracy and efficiency of laboratory testing. This system is designed to not only accurately test probes but also support a wide variety of other test applications. EG 2001CX provides exceptional accuracy and repeatability in probing and testing and makes it possible to scan wafers quickly and accurately. This advanced unit offers a high degree of flexibility to accommodate various patterns, complex masks, and sizes, with an automated interface that simplifies operation. It also offers various configurations, such as a multi-step process, a 4-axis approach, and a random access design. The 4-axis approach includes a random access step that automatically positions the probe to the appropriate test area by comparing the X-Y and theta table position. In addition to these powerful features, the machine also offers unparalleled accuracy and repeatability for wafer probing and testing. Through a combination of repeatability algorithms, repeatable motion, and advanced contact detection, ELECTROGLAS 2001 CX is capable of providing very precise results even at the smallest of scales. The tool also offers optional enhancements such as optical magnification, a wide range of illumination levels, and an advanced auto-cleaner. This asset also has integrated A/D processing that creates digital signals that are analyzed using a sophisticated mathematical algorithm. This algorithm improves repeatability and accuracy, which can deliver finer details than was previously possible. In conclusion, ELECTROGLAS / EG 2001 CX prober is an advanced, reliable, and highly accurate model that allows users to automate the probe testing process and extract precise and repeatable results. Its features allow users to scan wafers quickly and accurately, while its enhancements offer exceptional repeatability and precision. This equipment is an excellent solution for a large range of test applications.