Used ELECTROGLAS / EG 2001CX #9172345 for sale

Manufacturer
ELECTROGLAS / EG
Model
2001CX
ID: 9172345
Wafer Size: 8"
Wafer prober, 8" Disk based Gold plated chuck, 6" OLYMPUS SZ30 Microscope Eyepieces: GSWH 20x / 12.5 MELLES GRIOT Laser Configured for: Automatic wafer load Automatic wafer alignment Automatic wafer measurement Automatic wafer test / sort.
ELECTROGLAS / EG 2001CX Prober is a computer-controlled test and measurement equipment designed for electrically testing high-technology semiconductor device samples. It is equipped with a set of probes, each of which is connected to one of the sockets/connectors/pins of the device under test. Probing can be automatically configured and adjusted according to the specific device's parameters and physical requirements. The system is capable of performing wafer probing, samples probing, large device probing, high-temperature probing, analog measurements, and parallel and serial data transfer. The instrument is capable of collecting and analyzing data with a maximum speed of 15 million samples/second and can transfer up to 16 million parameters at a time. The digital input/output channels of the Prober feature high-bandwidth programmable logic circuits (PLCs). These are used for controlling the probing sequence and can be easily adjusted to provide higher speed and accuracy. The driver's amplifier circuit amplifies input signals and optimizes the probing power and accuracy. The built-in driver circuitry can detect and process a wide range of devices and voltages. The user-friendly touch-based interface, equipped with a 16" color LCD display, allows for a smooth and intuitive operation. The device includes advanced test and measurement software, which is extremely intuitive and simple to use. The data can be easily viewed, processed, and analyzed in various graphs and plots. The software provides various test and analysis tools and presets that make the probing process quick and efficient. The software also can read/write in various hardware formats (VME, PCI, etc). The unit is also furnished with relay cards, allowing for mechanical and electrical switching in order to control and switch probes simultaneously. It has excellent temperature stability and robust internal machine structure, allowing for stable, precise, and repeatable testing with minimal error or degradation. The instrument has full safety certifications, including GFCIs and EMC certification. Its heavy-duty and full metal housing, along with the touch-sensitive control buttons, ensure reliability and durability. The Prober is an ideal tool for electrical testing of semiconductor components, ICs, and board-level testing, and provides unmatched results in fast and precise testing.
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