Used ELECTROGLAS / EG 2001CX #9242391 for sale

ELECTROGLAS / EG 2001CX is a tool used to inspect a variety of semiconductors and related components. EG 2001CX combines the functions of automated prober and integrated inspection to yield comprehensive data on the quality of the device under test. The prober is designed to accurately inspect a wide range of semiconductor components, ranging from simple resistors to advanced integrated circuits. It performs precise manipulation and probing of component pins, allowing engineers to accurately measure parameters like threshold voltage, leakage current, noise, and power consumption. ELECTROGLAS 2001 CX is also able to provide a detailed overview of the component by combining high-resolution optical inspection, electrical measurement, and a host of other capabilities. The prober's customizable configuration is ideal for a variety of situations, and is designed to be user friendly. Its compatibility with a range of automation systems, including wireless, allows for ease of integration into an automated production line, and run time can be greatly reduced with its convenient memory settings. The prober supports up to 6 multiple SCUL and 6 multiple heater/clamp operation with its built-in alignment sensors, and advanced features such as integrated parametric testing help ensure accuracy. EG 2001 CX is backed by EG commitment to providing exceptional customer support. The prober is equipped with powerful diagnostic tools that provide detailed information for ordering replacement parts or servicing, as well as remote access for responsive troubleshooting. Its advanced Windows-based software is easy to learn and allows users to configure the prober to fit their specific testing requirements. In short, 2001CX is a powerful and reliable prober, offering accuracy and flexibility for testing a range of semiconductor components. Its intuitive software, compatibility with a wide range of automation equipment, and comprehensive customer support make it a great choice for a variety of testing needs.