Used ELECTROGLAS / EG 2001CX #9243023 for sale

Manufacturer
ELECTROGLAS / EG
Model
2001CX
ID: 9243023
Vintage: 2000
Prober Microscope arm OLYMPUS Low power scope Chuck type: Gold chuck top, 6" Ring carrier type: Rectangular probe card holder without holder Vision module type: COGNEX Auto align-PRM 2 Auto align: CCD Camera Table type: PT-201 High boy table Hot chuck Monitor type: LCD Operator console Monitor console Inker / Edge sensor box NCES Profiler Material handling 2000 vintage.
ELECTROGLAS / EG 2001CX is an advanced prober developed by EG Corporation for commercial use in the semiconductor industry. It is designed for high speed, automated probing of wafers and die, particularly for smaller geometry or low power applications. It is capable of probing up to 1400 pins per second with an accuracy of 1 micron. The prober uses a series of advanced optical, electrical, and mechanical components to precisely measure and characterize the electrical characteristics of test circuits on an integrated circuit chip. EG 2001CX prober has a variety of important features that are tailored for high speed testing. First, it features an automated XYZ positioning equipment and a multi-position wafer handler that allows for increased throughput. The prober is equipped with a high-speed computer controlled wafer stage that is capable of accurate, repeatable alignment of the wafer and die to the load board. Additionally, ELECTROGLAS 2001 CX prober also features an advanced optical system with a laser diode alignment unit, as well as an integrated vision machine for die and pattern recognition. In addition to automated XYZ positioning and wafer handling, ELECTROGLAS 2001CX prober is also capable of performing precision measurements of contact resistance and capacitance. It has a computer controlled signal processor with 12-bit resolution, as well as a multifunctional interface chip that allows for easier and more accurate measurements. The processor also has numerous measurement modes, including leakage current and transients. The advanced characteristics of EG 2001 CX prober enable it to probe components and chips with extreme precision. 2001 CX prober is also designed for reliable operation in a wide range of environments and applications. It has an operating temperature range of 0 to 50 degrees Celsius, and is also designed to be robust enough for 24/7 operation. Additionally, the prober is also equipped with an array of safety features, including a built-in emergency shut down switch and a safety lock switch that will prevent accidental activation of the prober. Overall, 2001CX prober is a highly advanced commercial tool for testing and characterization of integrated circuits. It features automated XYZ positioning and wafer handling, advanced optical components, and precision measurement capabilities, making it highly suited for testing small geometry and low power applications. Its robust design also allows for reliable operation in a wide range of working environments.
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