Used ELECTROGLAS / EG 2001CX #9260446 for sale

ELECTROGLAS / EG 2001CX is a computer-controlled wafer prober designed for inspecting and testing of high precision electronic and photonic devices through probing operations. It has a ceramic-based base and an open design for maximum accessibility. The equipment supports the use of multiple head configurations and has a 30-position calibration board to maximize the flexibility for test handling. The prober base is designed to move and tilt to accommodate different types of testing devices. This allows access to larger test devices, up to 2450 x 1150mm, with different height levels. It also features an adjustable tilt range from +5° to -20° to accommodate larger devices. Additionally, the 2001CDX has a touch screen with a graphical user interface and a linear positioning system with a range of +/- 50mm. This provides a range of high accuracy movements on the x, y and z axes. The unit is capable of handling wafers that measure up to 300mm in diameter. It features an automated wafer loading machine, which enables automatic alignment, unloading, and backside probing of wafers. This tool also offers a "teach" mode, which enables users to customize the asset fit to their specific production needs. The 2001CDX also has an advanced optical centering model that offers off-center centering schemes with a range of 0.1mm to 1mm. The 2001CDX is equipped with Wafer Manager I/O (WMIO) technology for automated wafer scheduling and tracking. This technology offers an online equipment of inventory, history, and process control interactions. This system also provides secure access to the unit controller and includes an integrated website for remote operations via the web browser. The prober is capable of multi-head configurations, which includes two heads for edge-probing, one head for through-wafer probing, one head for electrical contact probing, one head for micropositioning, and a few other specialized functions. The machine can also accommodate a variety of test accessories, such as optics, micro-positioning stages, high-speed data acquisition systems, and custom probes. The 2001CDX tool supports multiple wafer handling towers, which provides flexibility for handling multiple wafers concurrently. A single hand-positioned or automated wafer handling tower can be used with the asset to accommodate up to four batches of wafers for testing. The model also includes a probe card design and diagnostics station, providing multiple test signal pathways for an enhanced testing environment.