Used ELECTROGLAS / EG 2001CXE #9155108 for sale

ELECTROGLAS / EG 2001CXE is a probing equipment designed for high-performance semiconductor wafer probing. It offers comprehensive wafer contact testing of IC devices from 0.6mm pitch CSPs to 44 mil Fine-pitch Ball Grid Arrays. This system is capable of measuring up to 4 digital, 2 analog or 1 Power device on 150mm, 200mm or 300mm wafers. The unit is highly compatible with standard probe cards, allowing for the use of lower cost Mini-CardTM and large area contactor assemblies. The machine utilizes an advanced manipulation tool that ensures accurate wafer placement and provides a high degree of motion control accuracy. The motion control asset is capable of high speed X-Y motion of wafers as well as highly accurate piezoelectrically driven Z-axis motion. It also features 4-axis calibrations and correction for complex wafer misalignments. The model offers a host of options that enable users to customize and fine-tune their testing environment. It includes a wafer stop equipment to provide precise and consistent wafer position and an air bearing for wafer temperature control. It also includes a high-speed wafer pre-sample timer that precisely controls sample loading times for improved throughput and process optimization. Additionally, the system offers an optional positional overtravel-stop device to prevent overtravels and damages. EG 2001CXE also offers a variety of software options to suit the user's specific testing environment. It includes a graphical user interface (GUI) to provide complete control over the unit and an integrated CAD import machine to allow for time-saving setup and analysis of test data. Additionally, the tool provides high-end data acquisition capabilities with the Reflection Series data acquisition asset, providing faster turnaround times for testing and data analysis. The model is fully compliant with industry standards, including SEMI standards, and features long product life cycles for added reliability. The equipment is engineered with durability in mind with a reinforced cabinet and durable mechanical components. It also boasts low vibration levels, temperature stability, and variable temperature drying. In conclusion, ELECTROGLAS 2001 CXE is a highly advanced, high-speed prober designed for comprehensive wafer contact testing of IC devices. It offers a number of unique features and options for users to customize and fine-tune their testing environment and is fully compliant with industry standards for enhanced reliability.