Used ELECTROGLAS / EG 2001CXE #9208363 for sale

ELECTROGLAS / EG 2001CXE is a full-featured prober equipment. It is a tool used in semiconductor fabrication, device characterization, and research and development. It is well-suited for wafer probing, high-precision testing, and data acquisition. The system is a fully integrated architecture, which enables high-speed probing, fast switching, long dwell times, and superior low-level performance. The unit is designed to have a small footprint and offers flexibility for a wide range of applications. The machine is designed for high-speed probing and offers excellent accuracy, repeatability, and high throughput for wafer testing. EG 2001CXE is engineered with a proprietary CXE probe architecture. It features a large number of configurable switches, including programmable automatic scan sequencing, widely spaced channels for superior accuracy, and a high-speed pulse generator. The tool incorporates an advanced drive asset, including a driven three-axis linear stage and an integral vacuum clamp. The model is further complimented by the integrated optical laser equipment that enables non-contact probe alignment. The prober is engineered to provide a wide range of electrical conditioning and measurement capabilities, enabling efficient data acquisition. This includes Digital I/O, USB, IEEE-488 GPIB, ECL/TTL, and PLC/Machine Control. It also provides many standard and custom interfaces to control event-based measurement operations. ELECTROGLAS 2001 CXE also includes an advanced data acquisition and control engine. This includes a software-based virtual instrument, allowing users to graphically configure, control, and monitor their test setups, as well as enable advanced features such as real-time data analysis, comprehensive data management and statistical process control. 2001CXE is a reliable, flexible prober, tailored for the demanding applications of advanced semiconductor processes. It offers superior performance and accuracy for wafer testing, data acquisition, and device characterization. It is designed to improve throughput and reduce costs, while providing users with the flexibility to modify and configure their test setups.