Used ELECTROGLAS / EG 2001CXE #9260443 for sale

ELECTROGLAS / EG 2001CXE is a high-performance scanning prober manufactured by EG. It is designed for testing, debugging, and screening the electrical characteristics of semiconductor wafers at the wafer level. EG 2001CXE can be used for wafer-level probing, final test operations, and advanced process evaluation on different wafer sizes. The equipment has a high-precision semiconductor chuck and ultra-precision stage technology that makes it suitable for a wide range of applications, from low-volume technology development to large-scale device production. The prober has a 10.4-inch color LCD flat-panel display capable of displaying the wafer image. It has a sophisticated software suite with intuitive graphical user interface that allows users to quickly and easily configure probes, optimise measuring parameters, control test flow, and view and manage test results. The overall system consists of a computer control station, a feed-through unit, the linear stage and wafer chuck, the prober XY motor stage, a multi-axis motion control machine, and the probe cards. The prober is equipped with ServoAxis motion control offering fully automated apertures, aligning, probing, and testing operations with repeatable accuracy in nanometer increments. The prober also has a vacuum tool that includes a manifold chamber with an integrated vacuum pump, vacuum gauge, and appropriate valves and pipes. This vacuum asset ensures a firm vacuum grip of the entire wafer chuck to prevent wafer tilting and wafer motion. The prober also includes redundancy features for safety and improved yield. This includes dual-power supply, scan lines, probe cards, and I/O ports. The model also provides real-time monitoring of the parameters of the engine components to ensure optimum performance and minimize downtime. It also features a smart calibration equipment that tracks the status of the sensors and quickly detects any misalignment. ELECTROGLAS 2001 CXE is an ideal prober for a variety of flexible testing solutions, whether for development, manufacturing, or depot repairs. It has a range of advanced features that enable it to deliver more efficient and accurate probing that is ideal for various wafer testing or device evaluation projects.