Used ELECTROGLAS / EG 2001CXE #9260444 for sale
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ID: 9260444
Vintage: 2000
Prober
Microscope arm
OLYMPUS Low power scope
Chuck type: Gold chuck top, 6"
Ring carrier type: Rectangular probe card holder without holder
Vision module type: COGNEX Auto align-PRM 3
Auto align: CCD Camera
Table type: PT-201 High boy table
Ambient
Monitor type: CRT
Operator console
Monitor console
Inker / Edge sensor box
NCES Profiler
Material handling
2000 vintage.
ELECTROGLAS / EG 2001CXE is a precision prober designed to measure and inspect integrated circuits (ICs). It is suitable for connecting ICs to probes, testing ICs on wafers, and using ICs in various applications. EG 2001CXE has a dynamic resolution of up to 0.001µm, providing quick and accurate testing results. The architecture of the prober is similar to a scanning electron microscope, featuring a compact platform and a unique air bearing design. The prober features advanced automation systems that allow it to complete complex tasks in a fraction of the time. ELECTROGLAS 2001 CXE includes a number of standard features including two probes, a probe check chamber, a numeric keypad for manual data entry, a vacuum wafer chuck, a digital readout system, and a high-resolution optical pickup head. The integrated amplifier allows users to adjust the gain and offset of the signal. Additionally, the prober has an adjustable probe height, allowing it to be optimized for different applications. 2001CXE is also equipped with a flat-panel LCD display that is capable of displaying different types of measurement data, as well as a live image of the wafer being tested. This allows for real-time inspection and monitoring of the inspection process. The prober also features advanced software, which can be configured to automatically test specific parts of the ICs, as well as to test multiple wafers in one batch. EG 2001 CXE uses the latest precision mechanics and motion-control technology, providing a completely automated solution for testing ICs. The integrated software provides real-time analytics, allowing users to quickly identify and address faults or discrepancies. Additionally, the prober is compatible with the latest IC design and pin grid array (PGA) chipsets, ensuring that it is accurate and reliable. 2001 CXE is a powerful and reliable tool for testing and inspecting ICs. The prober's unique features and capabilities provide users with a cost-effective and reliable way of testing and inspecting ICs in a variety of applications. With its advanced automation systems, high resolution, and fast testing speeds, ELECTROGLAS 2001CXE is an excellent choice for IC testing and inspection.
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