Used ELECTROGLAS / EG 2001CXE #9260445 for sale

Manufacturer
ELECTROGLAS / EG
Model
2001CXE
ID: 9260445
Vintage: 1995
Prober Microscope arm OLYMPUS Low power scope Chuck type: Gold chuck top, 6" Ring carrier type: Rectangular probe card holder without holder Vision module type: COGNEX Auto align-PRM 3 Auto align: CCD Camera Table type: PT-201 High boy table Ambient Monitor type: CRT Operator console Monitor console Inker / Edge sensor box NCES Profiler Material handling 1995 vintage.
ELECTROGLAS / EG 2001CXE prober is a state-of-the-art testing equipment used in the manufacturing of electronic components and integrated circuits. It is designed for wafer probing, electrical characterization, and electrical automated test equipment (ATE) interface testing. EG 2001CXE offers advanced features and test capabilities that allow manufacturers to efficiently execute and pass tests on sensitive electronic components at critical yields. ELECTROGLAS 2001 CXE is equipped with a multi-axis, 6-axis-of-motion motion facility for probing large substrates. It can move x, y, z, angle (alpha) and theta with z- height control. Its closed loop servo system provides excellent accuracy and repeatability which enables ELECTROGLAS 2001CXE to maintain positioning during probe cycle operation as well as during linear and non-linear moves. Additionally, its auto-match unit ensures optimal contact performance regardless of device package size or number of rows required for the application. 2001 CXE has a sophisticated vision machine for robust positioning of substrates. It can use a variety of algorithms to find device position and orientation, including edge detection, fiducial detection, pattern matching or user-defined mapping. The vision tool also provides the operator with information about the device or board under test, such as component or device orientation, size, shape and precision alignment. 2001CXE offers a powerful, user-friendly and intuitive operator interface. It is easy to operate and control and the user can quickly change settings or submit commands. The command language is menu-driven and can be set up to accommodate flexible and customized options. The interface also has a graphical display mode that provides an overview of the asset and its status, allowing for easy and efficient monitoring of operational progress. EG 2001 CXE offers a high degree of functionality, reliability and throughput. Its superior speed and accuracy enable it to test sensitive devices quickly and accurately. In addition, its sophisticated loadable program acts as a data archive and offers the ability to access test results, circuit parameters and probe data. ELECTROGLAS / EG 2001 CXE is a powerful and efficient testing model that is used for a variety of applications in the electronics industry.
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