Used ELECTROGLAS / EG 2001CXE #9395837 for sale

ELECTROGLAS / EG 2001CXE is a high-performing prober designed for use in wafer probing applications. EG 2001CXE offers extensive electrical probing capabilities, enabling users to quickly and accurately measure device electrical parameters. The equipment features an open-architecture design, allowing for easy integration into most automation networks. Its advanced probing technology provides for accurate test results and fast probing cycles. ELECTROGLAS 2001 CXE features a high-precision "floating" wafer stage, capable of handling wafer sizes up to 200mm. The stage's advanced feedback control system ensures accurate placement and repeatability of measurements. The advanced dual-zone optical alignment unit utilizes a laser-scanning algorithm, allowing for accurately placed probes on die centers down to 1 micron. For precise positioning, the probe card movement range provides for 3-dimensional X, Y, and Z movement, enabling automated test site selection. ELECTROGLAS / EG 2001 CXE is a modular machine, allowing users to easily configure the tool according to their testing needs. Probing solutions include manual, semiautomatic, and fully automated performance options. The asset also features supports for various test applications, such as analog/RF, digital, LVS, and SOI. EG 2001 CXE is equipped with an Ethernet interface, allowing users to remotely monitor and control the model and probing operations. It also supports Ethernet, GPIB, and RS-232 protocols for integration into existing network infrastructures. The equipment's optional database management software helps to streamline test operations and increase efficiency. 2001CXE is also available with an optional on-board PC running Windows or Linux, allowing users to run custom test and control software. Additionally, the system can be further enhanced with an optional robot vacuum unit, designed to automate the probing process even further. 2001 CXE's advanced features and active probing technology provide users with reliable, accurate, and efficient performance, making it ideal for a variety of wafer probing applications.