Used ELECTROGLAS / EG 2001X #119684 for sale

ELECTROGLAS / EG 2001X
Manufacturer
ELECTROGLAS / EG
Model
2001X
ID: 119684
Wafer Size: 8"
Semi-automatic prober, 8".
ELECTROGLAS / EG 2001X is an automated prober specifically designed for the semiconductor industry. It is a multi-function equipment, capable of performing a variety of probing applications including high resolution probing, thermal imaging, metrology, precision machining and electrical characterization. The system also has a sophisticated software interface that can be customized according to the user's specific needs. EG 2001 X features a high precision, high speed probe chuck capable of handling individual probes as well as multiple probes simultaneously. The chuck is connected to an electronically driven x-y and rotational stage, allowing accurate positioning of the probes by vision guidance to quickly and accurately target the devices under test. The user can control the unit using an intuitive graphical user interface that allows for easy customization of the software. The interface allows for selectable probing modes, probe patterns, and manually adjustable probesettings, enabling the user to create complex and tailor-made probing configurations. ELECTROGLAS EG2001X offers a fast, reliable and accurate testing of semiconductor devices. The machine is fitted with a scan speaker to detect and analyze the electrical signals generated by the tested device. This allows for the evaluation of device performance as well as detection of electrical faults. The tool is also equipped with a powerful data acquisition asset, allowing for the collection of data during the testing process. This data can be stored and later can be viewed and analyzed with the included data analysis software. The automated prober is compatible with a range of different feeder, handler and loading mechanisms. This ensures compatibility with a broad range of different automatic test equipment and laboratory setups, providing a high degree of flexibility. ELECTROGLAS 2001X is an efficient and reliable automated prober ideal for use in the semiconductor industry. It features a fast and accurate design, an intuitive graphical user interface and a sophisticated data acquisition model, making it well suited for use in mission-critical applications.
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