Used ELECTROGLAS / EG 2001X #152201 for sale
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ELECTROGLAS / EG 2001X prober is an innovative tool used for testing and debugging semiconductor devices at the wafer and package level. It is a high-precision platform that delivers high-speed measurements and provides accurate characterization of various ICs and components. The prober is equipped with an automated alignment equipment, providing users with the flexibility to probe various ICs and components, such as transistors, chips, resistors, and capacitors, at any given angle or location on the wafer. It also enables the user to make contact with devices through probe cards. EG 2001 X is designed with robust features and a modular architecture, providing superior protection from environmental factors, such as dust and humidity. The prober also features a high-speed servo-motor system for precise and repeatable movement of the probing cards. To ensure optimum accuracy, the prober also features a built-in temperature control unit and a real-time, temperature compensation unit. This temperature control mechanism helps keep the machine calibrated and ensure that measurements are taken at the same temperature for each and every measurement. The prober also comes with a wide range of software applications that allow users to easily capture and analyze test data, enabling them to gain a better understanding of the tested devices. This data can be further used to identify issues and develop optimized solutions. In addition, the prober also comes with a comprehensive set of reporting tools that facilitate the comparison of different results and the uncovering of new information regarding the tested devices. Overall, ELECTROGLAS EG2001X prober provides users with a reliable and efficient platform for testing and debugging various ICs and components. Its high-precision technology ensures accurate measurements and its built-in temperature control unit ensures reliable and repeatable tests. With its powerful software applications and reporting tools, ELECTROGLAS 2001 X allows for the capture of a wealth of data and provides the flexibility necessary to identify issues and develop optimized solutions.
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