Used ELECTROGLAS / EG 2001X #186037 for sale

ELECTROGLAS / EG 2001X prober is a cost-effective, reliable, and powerful instrument that is used of wafer probing. It is a full-capability, automatic prober with a multi-axis motor platform driven equipment that allows for precise wafer tabling, movement and manipulation. The system is a computer-controlled precision scanning prober with a 40-position automatic matching unit. This matching machine supports up to 200mm wafers and also allows for loading and unloading of wafer at full speed. For tool debugging, the probe accepts a direct interface to many devices and systems. It has an intuitive Windows-based GUI for easy operation and debug assessment. The prober has an electromechanical design feature, which provides excellent repeatable performance on long product runs. The probe also has a reliable electronic edge detection asset with digital video imaging capability. This allows for rapid and accurate alignment and plating of probes onto the wafer. The probe can be used for both single and multi-site probing applications, as well as for measuring multiple signals with digital timestamps for each signal. Its fast-charge low-voltage probing capability is suited for advanced technology nodes and is reliable for automated sampling of high-speed I/O signals. The probe includes a powerful C software API, which enables users to develop custom probing algorithms and design their own test structures. It also includes a library of advanced probing algorithms, which makes probing easier, faster, and more accurate. EG 2001 X prober is designed for quick, accurate probing decoupling and self-integrity testing. This prober provides automated fabrication, testing, and characterization for wafer probes, and its removable probe cards, which allow for automatic socketing, enhance its versatility and reduce operational cost.