Used ELECTROGLAS / EG 2001X #186971 for sale

EG (ELECTROGLAS) ELECTROGLAS / EG 2001X prober is an automated wafer probing solution designed for fault detection, characterization and testing in the semiconductor manufacturing industry. It is an ideal tool for probing high-density electronic circuits and other structures, as well as integrated circuits (ICs) and discrete components. EG 2001 X is capable of performing both high-speed probing and the more precise, low-speed probing needed for device characterization and testing. ELECTROGLAS EG2001X features a high-precision, high-speed X-Y motorized stage which allows for quick, repeatable scanning of wafers with an accuracy of up to 1 μm. The equipment is also equipped with multiple sensor types as well as force control and active damping, providing unparalleled accuracy and repeatability. Additionally, the probe system can perform both coaxial and contact probing, enabling users to quickly characterize a wide range of components with varying voltage and impedance requirements. EG 2001X has several additional features for enhanced performance, including the ability to perform step-and-repeat probing, measure device parameters in multiple locations, and generate post-test engineering reports. The unit also includes various software tools, such as probing recipes and test macros, to automate and streamline test processes. ELECTROGLAS 2001X also integrates with ELECTROGLAS / EG Choice automation loading systems and VisionESAL light-guide loading systems for decreased downtime and increased throughput. In addition to its advanced features, ELECTROGLAS / EG EG2001X is designed for easy use and low maintenance. It requires minimal training to operate, and its modular design makes it easy to update or upgrade. The machine also incorporates self-checking, self-diagnostic, and self-adjusting capabilities, ensuring consistent and reliable performance. Overall, EG (ELECTROGLAS) EG2001X prober is an advanced, highly-accurate, and reliable probing solution for a wide range of semiconductor applications. Its combination of high-speed scanning, precise positioning accuracy, and various test features make it an ideal choice for fault detection, characterization and testing of high-density circuits and components.