Used ELECTROGLAS / EG 2001X #186974 for sale

ELECTROGLAS / EG 2001X is a networked digital prober in the 2000X family of probers manufactured by EG. EG 2001 X is developed for the demands of modern high-density semiconductor testing and boasts a wide array of features for high-speed probing and automated test simulations. ELECTROGLAS EG2001X provides a high-precision probing function with an X-Y accuracy of 4 microns in full scan and automation systems. It is equipped with 4-way bi-directional cross-roller slides and a compact compacted air bearing, which enhance the accuracy of the probe position when compared to competitors. 2001X also features a wide range of augers and optical alignment techniques for a variety of integration needs. EG2001X features an automated calibration system for solving a variety of calibration issues. This includes automatic start and end boundary scanning, and in-chamber automatic bending, which ensures that the prober is always performing optimally. All probing operations on ELECTROGLAS / EG 2001 X can be conducted under pressure with 60 dB of acoustic capping noise reduction. The system operates over a wide range of temperature and humidity ranges, and is designed to be energy efficient. 2001 X is designed with a flexible architecture, allowing it to grow with evolving testing needs. It supports multiple electrical, optical and digital access interfaces, and can be quickly integrated with ATE testers and automation systems. To simplify debug and troubleshooting, EG EG2001X has a built-in visualization tool for data analysis. ELECTROGLAS / EG EG2001X is the perfect prober for modern semiconductor test systems. It provides the features, accuracy and flexibility needed to test the most complex designs quickly and accurately. ELECTROGLAS 2001 X is a reliable, high-precision commercial package that solves current and future testing needs.