Used ELECTROGLAS / EG 2001X #293591488 for sale

ELECTROGLAS / EG 2001X is a prober designed to provide a high-performance semiconductor test environment. It is constructed to provide excellent accuracy and repeatability while detecting, sorting and measuring the electrical characteristics of integrated circuits. EG 2001 X is capable of testing both conventional and complex chipsets to enable complete characterization. It is equipped with a user-friendly interface and advanced technology including advanced data-sharing tools, integrated data analysis, EDA (electronic design automation) compatibility, and semi-automated debugging. It seeks to reduce manual inspection time and improve production rate and yield. ELECTROGLAS EG2001X has a wide range of probes, integrated test heads and three working positions with height adjustability, allowing the user to customize the prober according to the requirements of their specific tasks. Its probes are equipped with fine-pitch needles which can be used for direct contact testing of a vast range of electrical parameters such as current, voltage, and resistance. Its probes are highly reliable and accurate and can be precisely matched to the characterizing demands of any semiconductor package. The equipment's 400mm wafer stage offers three-dimensional alignment and fine position adjustment for accurate probing. Its DFA (die-for-alignment) and WFA (wafer-for-alignment) alignment tools provide high-quality results and reduce wafer misalignment with its alignment accuracy of ±7µm. 2001X is engineered with inlaid Tungsten-tipped needles to support prober head maintenance and reduce system replacement costs. It is designed with a moisture control unit, ensuring test temperatures remain consistent at all times. It offers an array of environmental control options to accommodate different test scenarios. EG EG2001X supports a wide range of input and output modules, as well as options for memory, plotting, and network connections for easy operation. Its probing and testing capabilities are complemented with features that enable processing and analysis. It offers the flexibility of integrating measurement suites, test program generators, and graphics displays. 2001 X is an ideal choice for electronic manufacturers who are looking for a high-performance prober that offers reliable and precise test results. With its wide range of features, the machine can be tailored to meet individual requirements. Its flexibility and comprehensive test options make it an excellent choice for fine-pitch probing and IC characterizing.