Used ELECTROGLAS / EG 2001X #293604672 for sale

ELECTROGLAS / EG 2001X is a prober designed for semiconductor wafer testing and probing. It is comprised of a mainframe, an XY stage, a prober head and a workstation. The mainframe provides the base for the prober and controls the workstation, XY stage and prober head. It is equipped with two CPUs and a variety of input/output interfaces. The XY stage provides accurate and repeatable movement of the wafer for the prober head assembly to test the device. It is a servo-motor driven stage driven by a two-loop motor control system with an accuracy of 5µm. The prober head provides 3 axes of motion for the testing of the wafer device with a Z resolution of 10µm and repeatable accuracy of 10µm. The prober head is equipped with a handle, a pneumatically driven prober arm, a prober tip, and an auto-align tool. The handle is used to manipulate the arm and tip while probing, while the pneumatically driven arm provides fine control of the prober tip. The prober tip is the interface between the probe and the device being tested, while the auto-align tool is used to position and fix the probe tip to the device. The workstation provides the operator with a graphical user interface (GUI) to set up and control the prober and XY stage, as well as to collect data from the device being tested. The workstation also enables device characterization through the use of pattern programming and wafer mapping software. It can be used to process and analyze data for evaluation of the device performance. EG 2001 X makes use of a variety of technologies to ensure accurate and repeatable testing and probing of semiconductor wafers. Each component of the prober is built to strict specifications and the system is designed to provide reliable and repeatable results.