Used ELECTROGLAS / EG 2001X #293604674 for sale

ELECTROGLAS / EG 2001X prober is an automated wafer prober designed for use in semiconductor wafer testing. The prober has a large automated XYZ stage with up to 400 mm of Z-Travel for tall devices like MEMS and photonics. Its large working area covers up to a 300 mm wafer, with no degradation in motion accuracy across the entire work surface. The prober also features a unique flexible pin design which provides a highly reliable and repeatable electrical path. This flexible connection enables the prober to operate with a wide variety of package types such as BGA, QFP, Flip Chip, and Leaded devices. The prober also features an Elastomer Technology for a secure, vibration-free surface that reduces noise and improves test yields. The AUTOMATED DRIVING ASSISTANT feature on EG 2001 X prober provides an intelligent vision equipment to automatically guide test probes to target pins. The vision system uses a Wizard Graphical User Interface to map out test programs helping operators quickly and accurately set up probers. The prober is also capable of performing constant time delay measurements which are important in testing wireless transceiver devices like Wi-Fi and Bluetooth. Additionally, ELECTROGLAS EG2001X prober has a centralized GUI that allows users to easily create and manage multiple test programs as well as monitor and control all probers in a single unit. The prober is powered by a Quad-Core Intel Xeon processor and up to 128 GB of RAM which makes for a reliable and fast wafer testing platform. EG2001X prober also offers a high degree of machine flexibility to ensure coverage of the changing needs of test engineering and operations. The tool features multiple Expandable Connectivity Nodes (ECNs), providing a modular and upgradable architecture that enables users to quickly expand capabilities to meet specific requirements. The ECNs offer an array of additional software and hardware options including data loggers and vision systems for automated device characterization, high precision metrology for wafer level testing, and multiple test head interfaces for testing of devices with different packages that require different types of probes. The prober's Windows environment allows for easy integration into standard lab networks and the established reliability of their hardware and software provide the user assurance of a secure and reliable environment. All of these features come together to create an automated prober that can handle a wide range of test applications. 2001 X is a powerful and highly capable automated wafer testing platform.