Used ELECTROGLAS / EG 2001X #293604675 for sale

ELECTROGLAS / EG 2001X prober is a high-end wafer testing instrument designed for use in semiconductor fabrication. It is capable of probing, inspecting and performing diagnostics on a wide variety of wafer types, including silicon, gallium arsenide, and SOI. The prober features an automated paddle-loading equipment, with up to ten paddles loaded onto the wafer carrier simultaneously. This system minimizes the time needed to place the wafer onto the prober, and allows for minimal interruption during the individual probe operations. The low acceleration and low frame vibration of the machine prevents damage to delicate devices and reduces position shift. EG 2001 X uses a nine-axis motion unit, which is capable of delivering high-precision motion profiles and speeds, up to speeds of 300 mm/s. The prober also has the ability to negotiate terrain with a Z-axis lift, which decreases wafer loading time, in addition to providing more accurate wafer placement. The commercial grade optical machine enables user alignment control of each of the needles, as well as providing an adjustable electrical connection for each needle. This ensures accurate and reliable connection to the test pads of the electronic components. The prober offers a variety of calibration capabilities, including alignment offset and needle tip calibration, along with the ability to synchronize multiple channels of probing simultaneously. Variable magnification capabilities enable the user to accurately view and monitor device alignment, with boosted signal-to-noise ratios to enhance the performance of the prober. The prober is equipped with various connectivity and data transfer features, such as GPIB, Ethernet, and SVGAM offering high-speed data transfers and maximum compatibility with semiconductor fabrication control systems. Additionally, ELECTROGLAS EG2001X also features program and data backup functions, which enable the user to securely recover all testing data, even after a power-cut. The comprehensive range of testing capabilities, along with the advanced motion and connectivity features, make ELECTROGLAS / EG 2001 X prober an essential tool for efficient semiconductor device testing.