Used ELECTROGLAS / EG 2001X #293604676 for sale

ELECTROGLAS / EG 2001X is a prober designed to provide automated micro-positioning of test devices to enable electrical parameters to be measured. It is based on a patented EVA™ (Electro-Vacuum Automation) equipment which consists of a movable platform, a vacuum tube and a proprietary controller system with high accuracy and repeatability. The probe station has a modular chassis that can be configured for a variety of needs, such as a single-by-one arrangement or a larger envelope for larger test structures. An array of measurement heads including contact and non-contact, capacitive, RF and ball probe tip styles enable to accurately measure small-scale electronic device parameters. EG 2001 X features an advanced vacuum unit, capable of handling common device types such as BGA's, QFN's, DIP's, packages and discrete components. The vacuum tube is equipped with dual vacuum seals which per-vacuum and fine-tune the pressure to obtain the optimum probe to device contact. Vacuum flow can also be adjusted to suit particular device type. The robotic controller machine is designed with a host of automated macro and user-defined sequences specifically designed to accelerate the test cycle time, while the advanced machine vision tool allows the asset to automatically adjust to compensate for misalignment. The advanced motor model employed allows for fast tool changes and exact positioning. The controller and software equipment offer a range of measurement capabilities. Test parameters can be displayed, monitored, stored and retrieved in custom libraries for easy and repeatable access. Comprehensive analysis functions include yield analysis, location mapping, and trend plotting to provide high quality analytical data. In conclusion, ELECTROGLAS EG2001X prober is a reliable, high accuracy, advanced automated tool which offers high productivity. It features superior ergonomics, cost-effectiveness and advanced flexible automation capabilities. It is a must have for any automated IC device measurement evaluation environment.