Used ELECTROGLAS / EG 2001X #293606275 for sale

ELECTROGLAS / EG 2001X prober is a high-performance, fully automated probing equipment designed for testing semiconductor devices. The system can be integrated with a variety of interface hardware and software to enable precise control of contact placement, pressure and impedance measurements. The prober is capable of performing both manual and automated contact testing. The prober features a non-destructive, patented, low-current penetration probe, which facilitates precise positioning of the contact pyramid. The hot chuck of the prober ensures reliable contact between probe and substrate, with a fast temperature rise time to ensure minimal thermal fluctuations. The high-performance, high-resolution Corescanner optics utilize digital edge recognition, to allow accurate and repeatable contact placement. The prober utilizes a multi-axis motion unit, combining a 6-axis robot arm and high resolution, high-speed vertical axis. The robot arm enables accurate and precise positioning of the probes, while the high-speed, high-resolution vertical axis allows for contact placement on high-density packages and highly non-planar topologies. The prober can be integrated with a variety of external hardware, such as optical inspection systems, Automatic Test Equipment (ATE) systems, and automatic tower handlers, allowing for greater control and flexibility. Additionally, the prober's digital scan control module allows for automated contact placement and optimization of contact parameters. The prober is powered by a robust Linux-based operating machine, and includes a number of advanced tools, such as an intuitive graphical user interface, scripting tools, digital contact optimization routines and other tools for automated testing. In addition, specialized software tools allow for the integration and control of external hardware, as well as digital connectivity for external devices. EG 2001 X prober is a highly versatile testing tool, offering a robust and reliable solution for contact testing of semiconductor devices. The prober's advanced features, integration capabilities and intuitive user interface enable users to easily optimize contact parameters and accurately place contacts according to their specific needs.