Used ELECTROGLAS / EG 2001X #293606276 for sale

ELECTROGLAS / EG 2001X is an advanced prober designed for use in semiconductor device reliability and failure analysis. It is capable of integrating advanced probing solutions for pinpointing and assessing device defects in topographical detail. The prober consists of a housing made of stainless steel with a top-mounted rotary selection turret, a vacuum system and multiple mating parts. The rotary selection turret houses two 8-armed wafer holders, two micromanipulatable probers and a micromanipulatable reference prober. The wafer holders enable the prober to secure wafers of various sizes and symmetrical patterns in a single motion. The prober utilizes a sophisticated closed-looped vacuum system along with a series of position feedback sensors and IR LEDs to ensure a precise and error-free alignment and secure connection of the probes to the device under test. The system is designed to provide a reliable connection with very low thermal transfer between the probes and the device, ensuring accurate electrical measurements even at high power densities. The prober features an intuitive, touch-driven user interface to make process setup and data-collection fast and easy. By allowing operator control of the motorized heads and individual prober heads, operators have the ability to customize capability and speed. The machine also offers a variety of analytical and engineering tools for more advanced users, such as automated geometric correction, atomic force microscopy imaging, and cutting edge electrical diagnostics for device characterization and fault analysis. EG 2001 X is a powerful and accurate tool for reliability and failure analysis of semiconductor devices. Its intuitive workflow, robust design, and advanced integrated prober solutions enables users to quickly identify device defects and optimize their designs to minimize failures and improve reliability.