Used ELECTROGLAS / EG 2001X #293620735 for sale

ELECTROGLAS / EG 2001X is a prober designed for high-precision electrical testing of semiconductor devices. It is used primarily for probing, measuring, and diagnosing semiconductor devices at the wafer and device levels. The prober's unique design enables its use in high-precision testing applications, including deposition, lithography, removal, and testing of semiconductor devices. EG 2001 X utilizes a wide range of probe heads and wafers, including ceramic, silicon, alumina, silicon nitride, gold and more. The prober is designed to provide probe force ranging from 0 to 35 grams, and probing speed up to 800 mm/s. The prober is capable of determining contact resistance and current/voltage characteristics over a temperature range of -65°C to +200°C. In addition, ELECTROGLAS EG2001X features a range of tools and processes to maximize the accuracy and speed of device testing. It utilizes automated wafer recognition and wafer alignment systems to ensure the correct wafer is inserted and the right location is probed. Furthermore, it features a full set of Z-commands for customizing probe sequencing and gain control. The prober is also able to hold up to 2000 wafers, with a maximum wafer size of 150mm. It is equipped with a graphical user interface (GUI) and communication interface for remote access. It includes an on-board digital signal processor (DSP) for digital signal processing, data acquisition, and logging. Additionally, the prober has advanced memory technology that allows for storing and transferring of test data, along with a comprehensive security system for secure data transfers. 2001 X is a reliable and accurate prober designed to meet the demanding needs of semiconductor device testing. Its wide range of features, tools, and processes make it an ideal choice for advanced testing applications, as well as high-precision measurements and diagnostics.