Used ELECTROGLAS / EG 2001X #293625467 for sale

ELECTROGLAS / EG 2001X is a semiconductor prober developed by Electrosoft Technologies, Inc. It is a fully automated, high-precision, high-speed prober that is capable of probing and testing a wide range of microelectronic devices. EG 2001 X features an advanced probe system that allows for easy setup and precise positioning of probes. The prober can accommodate multiple probe cards of various sizes, as well as separate probe cards for different geometries. The probe cards can be changed quickly and easily with minimal effort. The 2000X's computer-controlled servo motor allows for precise positioning of probes with minimal drift. The prober also features a large variety of automated test and alignment options. The automated test software allows the operator to quickly and accurately determine the performance of a device under a variety of test conditions. This is done with the help of test scripts, allowing the operator to quickly program the prober to set up, test and analyze the device. ELECTROGLAS EG2001X also provides a wide range of parametric and digital probes, allowing for precise measurements on a variety of semiconductor substrates. Parametric measurements can be performed on passive components, power device and logic devices, as well as on specific layouts. Digital probes allow for accurate measurement of internal node voltages, as well as the detection of short circuits and other defects. The prober is equipped with a high-accuracy pressure transducer, which provides precise and repeatable pressure measurement of contact force. This helps improve yield and accuracy of the test results. The prober also has a built-in vision system that can detect imperfections in the probing surface and take corrective measures to ensure accurate contact. ELECTROGLAS / EG EG2001X is an advanced prober that provides robust performance in a variety of test scenarios. With its advanced automated test, alignment, and probing capabilities, the prober is ideal for production testing of today's semiconductor devices. It provides superior accuracy and repeatability, as well as a wide range of features to simplify testing and increase yield.